New EDS To Identify Small Nano-structures

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New EDS To Identify Small Nano-structures

ATS Metallurgy and Failure Analysis group acquired a new Energy-Dispersive Spectroscopy (EDS) system to be used with the current Scanning Electron Microscope (SEM). Oxford AZtecLive is powered by Ultim Max and is the next generation Silicon Drift Detectors (SDD). The large SDD sensors allow up to 17x more data to be collected in the same time with no loss of accuracy. Whether you want to map larger areas, have better statistics in each data point, collect data much faster, or investigate the smallest nano-structures.  This new approach to EDS analysis will enable radical change in the way ATS perform sample investigation in the SEM. It combines a live electron image with live X-ray chemical imaging to give an intuitive new way of interacting with samples.