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is_page(): false
is_home(): false
is_singular(): true
Current template: template-canvas.php
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get_queried_object_id(): 54654
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Current query: Array ( [testing-and-analysis] => rlat [post_type] => testing-and-analysis [name] => rlat [testing-and-analysis-category] => radiation [error] => [m] => [p] => 0 [post_parent] => [subpost] => [subpost_id] => [attachment] => [attachment_id] => 0 [pagename] => [page_id] => 0 [second] => [minute] => [hour] => [day] => 0 [monthnum] => 0 [year] => 0 [w] => 0 [category_name] => [tag] => [cat] => [tag_id] => [author] => [author_name] => [feed] => [tb] => [paged] => 0 [meta_key] => [meta_value] => [preview] => [s] => [sentence] => [title] => [fields] => [menu_order] => [embed] => [category__in] => Array ( ) [category__not_in] => Array ( ) [category__and] => Array ( ) [post__in] => Array ( ) [post__not_in] => Array ( ) [post_name__in] => Array ( ) [tag__in] => Array ( ) [tag__not_in] => Array ( ) [tag__and] => Array ( ) [tag_slug__in] => Array ( ) [tag_slug__and] => Array ( ) [post_parent__in] => Array ( ) [post_parent__not_in] => Array ( ) [author__in] => Array ( ) [author__not_in] => Array ( ) [search_columns] => Array ( ) [ignore_sticky_posts] => [suppress_filters] => [cache_results] => 1 [update_post_term_cache] => 1 [update_menu_item_cache] => [lazy_load_term_meta] => 1 [update_post_meta_cache] => 1 [posts_per_page] => 8 [nopaging] => [comments_per_page] => 50 [no_found_rows] => [order] => DESC )

Applied Technical Services’ Family of Companies performs RLAT, or radiation lot acceptance testing, for different types of radiation effects on electronic equipment.

The Effects of Space Radiation

Space radiation causes adverse effects on electronic devices. These effects occur over varying periods of time, resulting in either malfunction or total failure. Although space systems can endure these effects, their equipment will lose functionality over time, eventually leading to failure due to cumulative, long-term damage.

Total Ionizing Dose (TID)

Total ionizing dose (TID) is a well-known effect on electronic devices facing radiation exposure. When a device experiences the effects of ionizing radiation for an extended period of time, the threshold voltages can change, causing an increase in transistor leakage. TID causes component malfunction or total failure.

Single Event Effect (SEE)

Single event effect (SEE) forms from a single energetic particle. It occurs when heavy high-energy protons or ions deposit energy while moving through a semiconductor component. SEE is either destructive or nondestructive and can potentially increase the risk of malfunction or total failure during aerospace operations.

Radiation Lot Acceptance Testing

Radiation lot acceptance testing is the process of inspecting semiconductor lots for different types of radiation. RLAT can take place before and after exposure to radiation. A standard deviation criterion for each parameter determines the success or failure of each irradiated part.

ATS: A Leader of Radiation Testing

Applied Technical Services’ Family of Companies extensively tests for the full range of radiation effects. We contribute to successful aerospace operations by working closely with clients in several different industries in order to provide them with knowledgeable insights on rad-hard designs and qualifications.

Quality Standards

ATS adheres to specific quality standards and protocols to confirm that our facility and lab meet all DLA standards, guidelines, and methods. We maintain a clean-room laboratory that complies with all security measures for RLAT on electronic devices produced for aerospace applications, including safety, reliability, logistical system alignments, and common measurement standards.

  • MIL-STD 883 and 750: TM 1080, 1023, 1021, 1020, 1019, and 1017
  • ESCC 25100
  • ESCC 22900
  • EIA/JESD57
  • ASTM F1192

Contact Us

The ATS Family of Companies provides turn-key test solutions for RLAT to characterize any changes in the performance of electronic devices due to the effects of radiation. Contact us today to request a free quote.

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