The Applied Technical Services Family of Companies (ATS FoC) performs single-event effects (SEE) testing on semiconductor devices to evaluate their radiation tolerance and failure thresholds. This process measures how semiconductors respond to individual ionizing-particle strikes before their electrical performance degrades beyond acceptable operating limits.
Radiation-induced interactions may affect semiconductor operation by:
- Corrupting critical data
- Disrupting operations
- Damaging components
- Causing device failure
How is SEE Testing Applied to Semiconductor Devices?
Our engineers apply SEE testing by exposing powered semiconductor devices to controlled heavy-ion or proton radiation while periodically monitoring electrical performance. During irradiation, they record radiation-induced events to determine susceptibility to single-event failures such as:
- Single Event Upsets (SEUs)
- Single Event Latchups (SELs)
- Single Event Transients (SETs)
- Single Event Functional Interrupts (SEFIs)
- Single Event Burnout (SEB)
- Single Event Gate Rupture (SEGR)
How is SEE Testing Data Used to Understand Semiconductor Radiation Tolerance?
Semiconductor SEE testing provides essential data to qualify components for mission-critical environments where reliability and radiation exposure are key concerns. This data also enables manufacturers to define safe operating limits, evaluate long-term reliability, and is often used to:
- Characterize radiation-induced failure mechanisms
- Assess mission risk
- Support component qualification
- Guide component selection, design, and mitigation strategies
- Compare SEE performance across various semiconductor technologies
Where Trusted Quality Meets Technical Expertise
Since 1967, manufacturers have trusted ATS for our comprehensive range of testing and analysis services. With advanced laboratory capabilities and engineering expertise, our team evaluates radiation tolerance, investigates failure mechanisms, and provides data to support reliability assessments and component qualification.
We maintain ISO/IEC 17025:2017 accreditations and operate under an ISO 9001:2015-registered quality management system. As part of SGS, ATS offers TICC clients access to an expanded global network of technical expertise, testing resources, and industry-leading solutions.
Contact Us
To get started with semiconductor SEE testing, submit a web form or call ATS at +1 (888) 287-5227 to speak with an expert today.
