The Applied Technical Services Family of Companies (ATS FoC) provides semiconductor total ionizing dose (TID) testing to analyze how semiconductor devices perform after prolonged exposure to radiation from gamma rays, X-rays, electrons, or protons.
TID testing identifies the maximum radiation dose a device can withstand before its electrical performance drops below critical thresholds. Understanding radiation tolerance helps manufacturers detect radiation-induced performance degradation before deployment, reducing the risk of costly failures in aerospace, defense, and other mission-critical applications.
How is TID Testing Data Used to Determine Semiconductor Radiation Tolerance?
Our engineers expose semiconductor devices to simulated radiation levels in a controlled environment and monitor key electrical parameters, including shifts in leakage current, threshold voltage, power consumption, and functionality throughout the evaluation.
The resulting TID data is used to:
- Determine radiation tolerance limits
- Qualify components for critical applications
- Compare device performance under radiation exposure
- Validate designs before deployment
- Improve long-term reliability and durability
Which Semiconductor Devices Require TID Testing?
Radiation-exposed environments such as aerospace, defense, satellite, and nuclear sectors often require TID testing to verify the long-term performance, reliability, and required JEDEC compliance of semiconductor devices such as:
- Integrated circuits (ICs)
- Microprocessors
- Microcontrollers
- Memory Devices
- Power Management ICs
- ASICs and FPGAs
- CMOS Devices
- Analog and Mixed-Signal Components
- Sensors
- Optoelectronic Devices
- Power Semiconductors (SiC and GaN devices)
Quality You Can Trust
Since 1967, ATS and our network of laboratories have delivered calibration, consulting, engineering, testing, forensics, and inspection services. Our experts leverage advanced laboratory capabilities and technical knowledge to provide solutions in metallurgy, environmental testing, chemical analysis, materials testing, and failure analysis.
We hold ISO/IEC 17025:2017 accreditations and operate under an ISO 9001:2015-registered quality management system. In 2026, we partnered with SGS to further our mission of building a safer, more reliable world.
Contact Us
To get started with semiconductor TID testing, complete our web request form or call ATS directly at +1 (888) 287-5227 to speak with an expert today.
