The Applied Technical Services Family of Companies (ATS FoC) conducts single-event upset (SEU) testing on semiconductor devices to assess their vulnerability to radiation-induced soft errors. This testing evaluates how semiconductors respond to ionizing-particle strikes that may alter stored data or logic states without causing permanent physical damage, helping manufacturers predict performance and reliability in radiation-exposed environments.
How is SEU Testing Applied to Semiconductor Devices?
Our engineers expose powered semiconductor devices to controlled heavy-ion, proton, or neutron radiation, then monitor and characterize upset behavior, such as:
- Data corruption
- Data transmission errors
- Memory corruption
- Cell bit flips
- Register-state changes
- Logic circuit upsets
- Soft errors in digital circuitry
- Error rates under defined radiation conditions
We then record and analyze soft-error events, determine their likelihood, and assess whether mitigation techniques, such as error-correcting code (ECC) memory, are needed.
How Does SEU Testing Determine Semiconductor Susceptibility to Radiation-Induced Soft Errors?
Semiconductor SEU testing provides essential data to qualify components for mission-critical environments where data integrity and reliability are primary concerns. Manufacturers use this information to predict soft-error performance, assess risk, and develop mitigation strategies.
SEU data helps to:
- Determine soft error rates (SER)
- Establish SEU cross-sections and upset thresholds
- Assess mission risk in radiation environments
- Support component qualification efforts
- Guide design, shielding, and error-correction strategies
- Compare SEU performance across semiconductor technologies
Quality Backed by Technical Excellence
Since 1967, manufacturers have relied on ATS for comprehensive testing and analysis services. With advanced laboratory capabilities and engineering expertise, our team evaluates semiconductor radiation tolerance, characterizes soft-error mechanisms, and provides data to support reliability assessments and component qualification.
We maintain ISO/IEC 17025:2017 accreditation and operate under an ISO 9001:2015-registered quality management system. As part of SGS, ATS offers clients access to a global network of technical expertise, testing resources, and industry-leading solutions.
Contact Us
To get started with semiconductor SEU testing, submit a web form or call ATS at +1 (888) 287-5227 to speak with an expert today.
