The Applied Technical Services Family of Companies (ATS FoC) performs semiconductor single-event transient (SET) testing to verify semiconductor device reliability and help manufacturers reduce the risk of mission failures caused by transient radiation effects. SET testing evaluates a semiconductor device’s response to single energetic particles that cause temporary voltage or current disturbances. This non-destructive process identifies momentary glitches or pulses in device output.
What Happens When a Semiconductor Experiences a Single-Event Transient (SET)?
A single-event transient (SET) is a brief voltage or current spike caused by a high-energy particle striking a semiconductor. SET testing helps engineers identify these events and assess their impact on system reliability. The risk and severity of disturbances depend on device design and operating conditions, leading to potential issues such as:
- False signals
- Timing errors
- Data corruption
- Logic glitches
- Communication errors
- Functional interruptions
Which Industries Rely on Semiconductor SET Testing?
Semiconductor SET testing is crucial in mission-critical radiation environments and applications where radiation-induced transient errors can affect system performance, including but not limited to:
- Military and Defense
- Areospace and Aviation
- Nuclear sectors
- Spacecrafts
- Satellites
Driven by Expertise, Backed by Quality
Since 1967, ATS and our expanding laboratory network have helped organizations across industries validate quality, reliability, and performance.
ATS is ISO/IEC 17025:2017-accredited and operates under an ISO 9001:2015-registered quality management system. As part of SGS, the world’s leading TICC provider, we now give clients access to a global network of industry-leading solutions.
Contact Us
To get started with semiconductor SET testing, complete our a web request form or call ATS directly at +1 (888) 287-5227 to speak with one of our radiation experts today.

