Our Methods of Analysis
The chemists who staff our contamination testing lab are very experienced in identifying a wide variety of contamination occurring from plant production lines or processes. Our Scanning Electron Microscope (SEM) and Fourier Transform Infrared Spectrometer (FTIR) are key tools in solving contamination issues. Inductively Coupled Plasma (ICP) and Ion Chromatography (IC) are also useful tools in determining the elemental makeup of a sample. Our main focus in contamination testing is to identify the contaminant and to help you determine where it is coming from so that you can eliminate it.
Our Hitachi S-3700N scanning electron microscope (SEM) is outfitted with a light element Oxford/Link energy dispersive spectrometer (EDS). The SEM boasts a very generous depth of field with a magnification range of 5 to 200,000X. Through the use of the SEM/EDS techniques, we can determine the elements present in the contaminant.